Role of the substrate thickness for the structural properties of organic-organic heterostructures |
| |
Authors: | Dimas G de Oteyza Stefan Sellner Helmut Dosch |
| |
Institution: | a Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, 70569 Stuttgart, Germany b Institut für Theoretische und Angewandte Physik, Universität Stuttgart, 70550 Stuttgart, Germany c Institut de Ciència de Materials de Barcelona CSIC, 08193 Bellaterra, Spain |
| |
Abstract: | F16CuPc deposited on pentacene is characterized by the coexistence of two different configurations: F16CuPc is found in the standing up phase (“s-configuration”) on top of pentacene terraces and in a lying down phase (“l-configuration”) at pentacene step edges. By combining AFM and grazing incidence X-ray diffraction we show that the ratio between F16CuPc in l- and s-configurations increases with thickness of the pentacene substrate film, demonstrating the role of the pentacene steps as nucleation centers for the F16CuPc l-configuration. Experiments performed with ultra-thin pentacene thicknesses disclose that the F16CuPc l-configuration does not grow on top of the first and second pentacene layers, pointing to the action of long-range interactions with the substrate. |
| |
Keywords: | Atomic force microscopy In situ characterization Molecular beam epitaxy X-ray scattering Growth Self-assembly Heterojunctions Organic semiconductors |
本文献已被 ScienceDirect 等数据库收录! |