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Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM |
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| Authors: | Toshiyuki Taniuchi Hiroshi Kumigashira Masato Kubota Takanori Wakita Takanori Yokoya Kanta Ono Masaharu Oshima Mikk Lippmaa Hideomi Koinuma |
| Institution: | a Department of Applied Chemistry, The University of Tokyo, Bunkyo-ku, Tokyo 113-8656, Japan b Core Research for Evolutional Science and Technology (CREST), JST, Kawaguchi, Saitama, 332-0012, Japan c Institute of Materials Structure Science, KEK, Tsukuba 305-0801, Japan d Research Laboratory for Surface Science, Faculty of Science, Okayama University, Okayama 700-8530, Japan e Institute for Solid State Physics, The University of Tokyo, Kashiwa 277-8581, Japan f Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan g National Institute for Materials Science, Tsukuba 305-0047, Japan |
| Abstract: | We have used photoelectron emission microscopy (PEEM) and X-ray magnetic circular dichroism (XMCD) to study the effect of thin film thickness on the magnetic domain formation in La0.6Sr0.4MnO3 samples that were epitaxially grown on stepped SrTiO3 (0 0 1) substrates. The magnetic image exhibited a stripe structure elongated along the step direction, irrespective of film thickness, suggesting that uniaxial magnetic anisotropy induced by step-and-terrace structures plays an important role in the magnetic domain formation. Additional domains evolved gradually with increasing film thickness. In these domains, the direction of magnetization differed from the step direction due to biaxial magneto-crystalline anisotropy. The evolution of additional magnetic domains with increasing film thickness implies that a competition exists between the two anisotropies in LSMO films. |
| Keywords: | PEEM XMCD Spintronics Magnetic domain Manganite Thin film |
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