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Effect of curvature on interfacial segregation: Electronic contribution to the point defect/interface binding energy |
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| Authors: | P. A. Deymier J. O. Vasseur |
| Affiliation: | (1) Department of Materials Science and Engineering, University of Arizona, 85721 Tucson, AZ, USA;(2) Equipe de Dynamique des Interfaces, Laboratoire de Dynamique et Structure des Matériaux Moléculaires, U.R.A. C.N.R.S. no 801-U.F.R. de Physique, Université de Lille I, 59655 Villeneuve d'Ascq, Cédex, France |
| Abstract: | The electronic contribution to the driving force for segregation to a curved interface between a cylindrical fiber of insulator embedded in a metal matrix is calculated. The solute/curved-interface binding energy is shown to vary as the inverse of the radius of curvature of the interface in the limit of a small radius. This result implies that the propensity for segregation of curved interfaces is larger than that of planar interfaces. |
| Keywords: | Segregation curved interface composite |
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