| Abstract: | The polarization properties of an optical system, source–interferometer–polarizer–polymer film–detector, have been calculated. Using Mueller matrices, the intensity has been obtained as a function of polarizer angle. It is shown in some detail how polarization of the beam in both interferometer and detector optics distort the spectra. The contributions from the finite extinction ratio of the polarizer are also calculated and intensity variations caused by beam-wandering are discussed. It is shown that the commonly used procedure for correcting the spectra is wrong. Better methods for correcting the spectra are proposed. The influence of a uniaxial refractive index on the data is discussed, and experimental methods that can deal with refraction effects are presented. © 1993 John Wiley & Sons, Inc. |
