| Abstract: | A new technique using negative-ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive-ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular ions at the expected m/z values. It was demonstrated that negative-ion fast atom bombardment ionization was the most suitable method of ionization for structure elucidation studies for the compounds described. |
