Electron and X-ray diffraction studies of chemically deposited thin films of cadmium selenide following reaction with mercury(II) chloride solution

The reaction between thin films of CdSe and aqueous HgCl₂ was studied using electron diffraction (ED) powder X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). It was found that α-Hg₃Se₂Cl₂ is formed in the CdSe film following its reaction with 0.01 M HgCl₂ for a period of 5 minutes. Upon completion of the reaction of CdSe powder with 0.01 M HgCl₂, Hg₂Cl₂ is present in addition to α-Hg₃Se₂Cl₂ in a molar ratio of 1:3.1. The effect of air annealing on CdSe powder was also studied. Heating in air to 450°C for 1 hour resulted in an XRD pattern corresponding to the hexagonal form of CdSe.