In situ atomic force microscopy study of exfoliation phenomena on graphite basal planes

In situ atomic force microscopy (AFM) was used to study the morphology changes of a highly oriented pyrolytic graphite (HOPG) electrode modeling the negative electrode used in commercial lithium-ion batteries. During the charge (lithiation) process in 1 M LiClO4 in ethylene carbonate:propylene carbonate (1:2) electrolyte we found that, degradation processes similar to the exfoliation of graphite also occur on basal planes. First a web-like structure of fine cracks develops which eventually results in local blister formation.