Hysteresis models of dynamic mode atomic force microscopes: analysis and identification via harmonic balance |
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| Authors: | Michele Basso Donatello Materassi Murti Salapaka |
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| Institution: | (1) Dipartimento di Sistemi e Informatica, Università di Firenze, via S. Marta, 3, 50139 Firenze, Italy;(2) Electrical and Computer Engineering Department, University of Minnesota, Minneapolis, MN 55455, USA |
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| Abstract: | A new class of models based on hysteresis functions is developed to describe the operation of dynamic mode atomic force microscopy.
Such models can account for dissipative phenomena affecting the interaction between the probe and the sample. The model analysis,
which is developed using frequency domain techniques, provides a insights into experimentally observed behavior. Experimental
data corroborates the models developed. |
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| Keywords: | Atomic force microscopy Hysteresis Harmonic balance Identification Nanotechnology Lur’ e system |
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