| 三乙基铟中杂质元素的ICP─AES测定 |
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| 引用本文： | 王春梅,张淑珍,吴琼. 三乙基铟中杂质元素的ICP─AES测定[J]. 光谱实验室, 1995, 0(3) |
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| 作者姓名： | 王春梅 张淑珍 吴琼 |
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| 作者单位： | 天津电子工业部第４６研究所 |
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| 摘 要： | 研究了基体铟对１５种杂质分析元素谱线的背景影响和光谱谱线干扰，采用基体匹配－电感耦合等离子体发射光谱法测定了三乙基铟中的１５种杂质元素。样品分析方法的检出限大部分低于１μｇ／ｇ，相对标准偏差均小于２％。
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| 关 键 词： | ICP－AES，三乙基铟，杂质元素，基体匹配法 |
Determination of Elements in Triethylindium by Inductively Coupled Plasma Atomic Spectrometry |
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| Wang Chunmei,Zhang Shuzhen, Wu Qiong. Determination of Elements in Triethylindium by Inductively Coupled Plasma Atomic Spectrometry[J]. Chinese Journal of Spectroscopy Laboratory, 1995, 0(3) |
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| Authors: | Wang Chunmei Zhang Shuzhen Wu Qiong |
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| Abstract: | In this article, it was reported that ICP-AES was used to analyze impurities in triethylindium. Indinm matrix could not produce any background and spectral overlapping interferences. |
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| Keywords: | ICP-AES Triethylindium Trace Element Matching Method by Matrix. |
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