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Role of oxygen impurity in growth and magnetic properties of Ni83Fe17 permalloy thin films |
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| Authors: | P Chowdhury Harish C Barshilia PK Mishra DV Sridhara Rao |
| Institution: | a Surface Engineering Division, National Aerospace Laboratories (CSIR), Bangalore 560 017, India b Technical Physics and Prototype Engineering Division, Bhabha Atomic Research Center, Mumbai 400 085, India c Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK |
| Abstract: | To study the influence of oxygen impurities in the sputtering atmosphere on microstructure, and the magnetic and magnetotransport properties, thin films of Ni83Fe17 were deposited under dc magnetron sputtering technique into which regulated oxygen gas was introduced. The partial pressure of oxygen was varied from 2×10−7 to 3×10−6 mbar. X-ray diffraction patterns indicate the reduction of grain growth with increasing the oxygen partial pressure. The grain microstructure and the composition were confirmed through high resolution transmission electron microscopy attached with Scanning Transmission Electron Microscopy (STEM). Transition from canted to rectangular magnetic hysteresis loop was observed through magnetization measurements for samples prepared under higher oxygen partial pressure which implies the structural changes in the magnetic domain formation. These observations were further confirmed through the measurements of anisotropic magnetoresistance properties. |
| Keywords: | Permalloy thin film Ni83Fe17 Magnetisation Magnetoresistance |
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