Optimal Design of Accelerated Degradation Test based on Gamma Process Models

In this paper, optimal constant-stressaccelerated degradation test plans are developed under theassumption that the degradation characteristic follows a Gammaprocesses. The test stress levels and the proportion of unitsallocated to each stress level are determined by D-criterion andV-criterion. The general equivalence theorem (GET) is used toverify that the optimized test plans are globally optimum. Inaddition, compromise test plans are also studied. Finally, anexample is provided to illustrate the proposed method and asensitivity analysis is conducted to investigate the robustness ofoptimal plans.