SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement |
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Authors: | G A Shaw J Kramar J Pratt |
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Institution: | (1) U.S. National Institute of Standards and Technology, Manufacturing Engineering Laboratory, 100 Bureau Dr., Gaithersburg, MD 20899, USA |
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Abstract: | A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors
in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these methods
must be validated within the International System of Units (SI). To this end, two different contact techniques were used to
calibrate the spring constant of a cantilever beam. First, a dynamic indentation-based method was used to measure the spring
constant of a rectangular cantilever beam. These results were then compared against an SI-traceable spring constant measurement
from an electrostatic force balance (EFB). The measurements agree within experimental uncertainty and within 2% for spring
constants greater than 2 N/m. The use of this cantilever beam as a transfer artifact for in situ AFM cantilever calibration
was then evaluated in comparison to the thermal calibration method. Excellent agreement is seen between these techniques,
establishing the consistency of the thermal and dynamic indentation methods with SI-traceable contact cantilever calibration
for the rectangular cantilever geometry tested.
Disclaimer: This article is authored by employees of the U.S. federal government, and is not subject to copyright. Commercial
equipment and materials are identified in order to adequately specify certain procedures. In no case does such identification
imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials
or equipment identified are necessarily the best available for the purpose. |
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Keywords: | Atomic force microscopy Nanotechnology Calibration Mechanical engineering |
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