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金属纳米颗粒-聚电解质多层膜的X射线反射率研究
引用本文:李秀宏,谭智敏,黄兰,李晓龙,麦振洪,李明.金属纳米颗粒-聚电解质多层膜的X射线反射率研究[J].高等学校化学学报,2004,25(7):1314-1317.
作者姓名:李秀宏  谭智敏  黄兰  李晓龙  麦振洪  李明
作者单位:1. 中国科学院物理研究所, 北京 100080; 2. 北京大学化学与分子工程学院, 北京 100871
基金项目:国家自然科学基金 (批准号 :10 2 740 96和 5 0 173 0 0 1)资助
摘    要:用静电自组装技术制备了不同层数的Au纳米颗粒-聚电解质多层膜,用X射线反射及原子力显微镜对膜的微结构进行了表征.研究发现,当Au纳米颗粒下面的聚电解质层较薄时,膜中无清晰的界面结构;随着Au纳米颗粒下面的聚电解质层的增厚,金属-聚电解质多层膜的界面变得越来越清晰.

关 键 词:静电自组装  聚电解质  多层膜  界面  X射线反射率  
文章编号:0251-0790(2004)07-1314-04
收稿时间:2003-06-17

X-ray Reflectivity Studies on Metal Nanoparticle/Polyelectrolyte Multilayers
LI Xiu-Hong ,TAN Zhi-Min ,HUANG Lan ,LI Xiao-Long ,MAI Zhen-Hong ,LI Ming.X-ray Reflectivity Studies on Metal Nanoparticle/Polyelectrolyte Multilayers[J].Chemical Research In Chinese Universities,2004,25(7):1314-1317.
Authors:LI Xiu-Hong  TAN Zhi-Min  HUANG Lan  LI Xiao-Long  MAI Zhen-Hong  LI Ming
Institution:1. Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China; 2. College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China
Abstract:Electrostatic self-assembly technique was used to prepare Au-nanoparticle/polyelectrolyte multilayers. The microstructures of the films were characterized by X-ray reflectivity and the atomic force microscopy. It is found that when the polyelectrolyte layers under the Au nanoparticles were thin, there were no clear interfaces in the films; when the polyelectrolyte layers got thick, the interfaces become clear. Therefore, it needs to increase properly the thickness of the polyelectrolyte layers in order to get the metal nanoparticle/polyelectrolyte multilayers with clear interfaces.
Keywords:Electrostatic self-assembly  Polyelectrolyte  Multilayer films  Interfaces  X-ray reflectivity  
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