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A comparison of LEED intensity data from chemically polished and cleaved GaAs(110) surfaces |
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| Authors: | Peter Mark Piero Pianetta Ingolf Lindau WE Spicer |
| Institution: | Department of Electrical Engineering, Princeton university, Princeton, New Jersey 08540, USA;Department of Electrical Engineering, Stanford Electronics Laboratories, Stanford University, Stanford, California 94305, USA |
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