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Monte‐Carlo simulation of secondary electron emission by x‐ray irradiation—an application of x‐ray absorption near‐edge structure (XANES)
Abstract:A Monte‐Carlo simulation program has been developed for describing x‐ray absorption near‐edge structure (XANES) observed by synchrotron radiation. The Monte‐Carlo simulation was applied for interpreting XANES spectroscopy on a polycrystalline Ag specimen under synchrotron irradiation with photon energy 3340–3390 eV around the absorption edge of the Ag Lα line at 3352 eV. The results clearly indicate that Monte‐Carlo simulation describes the experimental results with considerable success. Dependence of secondary electron yield on the incident angle of synchrotron radiation was also studied. Copyright © 2004 John Wiley & Sons, Ltd.
Keywords:Monte‐Carlo simulation  PEEM  photoelectron  Auger electron  secondary electron
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