Brewster Anomalies in Opaque Random Amorphous Multilayers a-Si:H/a-Si3N4+x:H

Reflectance anomalies of random amorphous multilayers are shown to be different dependence on the incident angle for s- and p-polarized light by simulation. Disappearance of these anomalies has especially been observed for p-polarized light propagation at a certain incident angle. It is shown that this incident angle is the extended Brewster angle defined for opaque materials. This phenomenon, i.e., the disappearance of reflectance anomalies, is the Brewster anomaly in random amorphous multilayers made with absorbent materials. Preliminary results of experiments are also presented.