Identification and Classification of Iridescent Glass Artifacts with XRF and SEM/EDX |
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Authors: | Dubravka Jembrih Manfred Schreiner Momtchil Peev Peter Krejsa Christian Clausen |
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Institution: | (1) Institute of Chemistry, Academy of Fine Arts, Schillerplatz 3, A-1010 Vienna, Austria, AT;(2) Institute of Analytical Chemistry, Vienna University of Technology, Getreidemarkt 9/151, A-1060 Vienna, Austria, AT;(3) Austrian Research Centre Seibersdorf, A-2444 Seibersdorf, Austria, AT;(4) Schinzlgasse 3, A-2500 Baden, Austria, AT |
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Abstract: | Art Nouveau (Tiffany, Loetz) and modern (Jack Ink, Strini Art Glass) iridescent glass fragments were characterized using
energy dispersive X-ray fluorescence analysis (EDXRF) and energy dispersive X-ray microanalysis in a scanning electron microscope
(SEM/EDX) in combination with factor analysis in order to obtain clustring. A character istic of Tiffany glass fragments is
leaded bulk glass, whereas in the case of Loetz K-Ca-Si bulk glass could be determined. Modern glass fragments show a high
amount of Na (7 wt% in the bulk of Jack Ink) and 0.6–1.5 wt% Sr in the bulk of Strini Art Glass. The contents of Si and Ca
are similar to Loetz glass. Furthermore, the differences in the structure of the glass artifacts could be determined. The
cross-sections of Tiffany show a layered structure of the bulk without a specific surface layer whereas the cross-sections
of Loetz glass reveal a homogeneous bulk material with one or two homogeneous surface layers in the BE-image. In the case
of the Jack Ink a homogeneous bulk glass and an inhomogeneous multilayered surface could be determined. Strini Art Glass show
a homogeneous bulk glass and a homogeneous surface layer in the backscattered electron image. |
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Keywords: | : Energy dispersive X-ray fluorescence analysis (EDXRF) energy dispersive X-ray microanalysis scanning electron microscopy (SEM/EDX) factor analysis clustering iridescent glass Art Nouveau Tiffany Loetz Jack Ink Strini Art Glass |
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