241Am-XRF analysis of rare earths in geological samples |
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Authors: | G. Lagarde J. Larcher |
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Affiliation: | (1) Laboratoire de Chimie Nucléaire, Centre de Recherches Nucléaires, B. P. 20, 67037 Strasbourg Cedex, France |
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Abstract: | Rare earths in sediments are analyzed by X-ray fluorescence using241Am as an excitation source. The analytical sensitivity lies in the ppm range. |
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Keywords: | |
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