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A two-dimensional numerical analysis of a small geometry MOSFET
Authors:LA Akers
Institution:Department of Electrical Engineering, University of Nebraska, Lincoln, NE 68588, USA
Abstract:This paper describes the development of a computer model to simulate small geometry metal-oxide-semiconductor field effect transistors (MOSFETs). The model is developed by obtaining computer generated solutions to the phenomenological equations which describe carrier transport and the electric fields in a semiconductor device. Threshold voltage variations and breakdown effects are also discussed.
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