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一种大功率窄脉冲半导体激光器测试台的研制
引用本文:陈胜石,欧秋晔,宁子立,薛常佳,纪明,周丽华,张晓辉. 一种大功率窄脉冲半导体激光器测试台的研制[J]. 应用光学, 2009, 30(4): 712-716
作者姓名:陈胜石  欧秋晔  宁子立  薛常佳  纪明  周丽华  张晓辉
作者单位:1. 西安应用光学研究所,陕西,西安710065
2. 中国人民解放军驻西光集团军代室,陕西,西安,710043
摘    要:大功率窄脉冲半导体激光器主要光电性能参数为:输出峰值光功率、阈值电流、正向电压、上升时间、峰值波长、光谱半宽、半强度角.根据激光制导系统对大功率窄脉冲激光器参数的特殊测试要求,研制一种大功率窄脉冲激光器测试平台,将小型化大功率激励器功放模块、大范围可调DC-DC模块、信号源板、激光器座、光学准直镜集成在一个平台上,与峰值功率计、光谱仪、CCD摄像机等仪器配合,可测出大功率窄脉冲激光器的峰值功率、峰值波长及波长随温度变化的漂移特性、发光芯均匀性等参数.介绍了大功率窄脉冲激光器测试台的特点,并对测试结果作了论述.

关 键 词:大功率窄脉冲半导体激光器  发光芯  激励器  峰值波长
收稿时间:2009-02-27

Test setup for high power narrow pulsese miconductor laser
CHEN Sheng-shi,OU Qiu-ye,NING Zi-li,XUE Chang-jia,JI Ming,ZHOU Li-hua,ZHANG Xiao-hui. Test setup for high power narrow pulsese miconductor laser[J]. Journal of Applied Optics, 2009, 30(4): 712-716
Authors:CHEN Sheng-shi  OU Qiu-ye  NING Zi-li  XUE Chang-jia  JI Ming  ZHOU Li-hua  ZHANG Xiao-hui
Abstract:According to the special test request of the laser guidance system for the high power narrow pulse semiconductor lasers, a test setup for testing peak optical power output, threshold current, forward voltage, rise time, peak wavelength and spectrum width of the high power narrow pulse semiconductor lasers was developed. The setup consists of the miniaturization power-amplification module of high-power actuator, large-scale adjustable DC-DC module, signal generator, collimating mirror, laser peak power meter, laser spectrum analyzer and CCD pickup camera. The peak power of emission, peak wavelength of emission, wavelength drift characteristic with temperature and luminous core uniformity of high power narrow pulse semiconductor lasers can be tested. The features of the test setup are presented and the test results are elaborated.
Keywords:high power narrow pulse semiconductor laser  test setup of semiconductor laser  actuator  peak wavelength
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