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Enhancement of near-band edge photoluminescence of ZnO thin films by employing MgF2 buffer layer
Authors:Ruijin Hong  Jianda Shao  Hongbo He  Zhengxiu Fan
Institution:

aResearch and Development Center for Optical Thin Film Coatings, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, PR China

bGraduate School of Chinese Academy of Sciences, Beijing 100864, PR China

Abstract:ZnO/MgF2/ZnO sandwich structure films were fabricated. The effects of a buffer layer on structure and optical properties of ZnO films were investigated by X-ray diffraction, photoluminescence, optical transmittance and absorption measurements. Measurement results showed that the buffer layer had the effects of improving the quality of ZnO films and releasing the residual stresses in the films. The near-band edge emissions of ZnO films deposited on the MgF2 buffer layer were significantly enhanced compared with those deposited on bare substrate due to the smaller lattice mismatch between MgF2 and ZnO than that between fused silica and ZnO.
Keywords:A3  Physical vapor deposition  B1  Oxides  B2  Semiconducting II–VI materials
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