Deposited metamaterial thin film with negative refractive index and permeability in the visible regime |
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| Authors: | Jen Yi-Jun Chen Chih-Hui Yu Ching-Wei |
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| Institution: | Department of Electro-Optical Engineering, National Taipei University of Technology, Taipei, Taiwan. jyjun@ntut.edu.tw |
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| Abstract: | Thin films are fabricated from arrays of silver nanorods with thicknesses of 160?nm and 200?nm, to function as a metamaterial. The negative refractive index and negative permeability are retrieved from measured reflection and transmission coefficients using walk-off interferometer in the visible regime. A negative-index-material thin film with negative permittivity or (and) permeability can be produced by glancing angle deposition. |
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