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Dynamic and microscopic X-ray characterization of a compound chevron layer in electroclinic liquid crystals
Authors:Atsuo Iida   Yumiko Takahashi  Yoichi Takanishi  Michi Nakata  Ken Ishikawa  Hideo Takezoe
Affiliation: a Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho Tsukuba, Ibaraki 305-0801, Japanb Department of Physics, Nihon University, Surugadai, Kanda, Chiyoda-ku, Tokyo 101-8308, Japanc Department of Organic and Polymeric Materials, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152-8552, Japan
Abstract:The local layer structure of surface stabilized electroclinic liquid crystals has been analysed by time-resolved synchrotron X-ray microdiffraction. At a low applied electric field, the initial bookshelf structure starts to respond above a threshold voltage. With a low to medium applied field of triangular form, the layer structure transforms reversibly between the bookshelf (low field) and the compound chevron (high field), in which the vertical and horizontal chevrons alternate along the layer. When the horizontal chevron component appears, a stripe texture can be seen in an optical micrograph. With increasing field, the horizontal chevron becomes a dominant structure while the vertical chevron still remains. The layer spacing changes in correlation with the chevron angle during the field application. At high field, surface molecules partly rearrange, resulting in alignment deterioration at the interface. The layer response time for an a.c. square wave field is of the order of a few µs to ten µs, which is close to the optical response. The appearance of the compound chevron is discussed in conjunction with the anchoring effect.
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