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Temperature coefficient of resistivity for polycrystalline Cu-films |
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| Authors: | KhM Mannan |
| Institution: | Physics Department, University of Dacca, Dacca 2, Bangladesh |
| Abstract: | The variation of temperature coefficient of electrical resistivity for polycrystalline copper films with thickness can be explained if temperature variation of the mean free path in a single grain and the scattering of charge carriers at the grain boundary are taken into account. |
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