| Abstract: | Micro‐fabricated bi‐prisms have been used to create an interference pattern from an incident hard X‐ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm‐thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano‐sized probe and the choice of single‐crystal prism material. A full near‐field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8‐ID‐I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material. |
