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Noise in the wire: The real impact of wire resistance for the Johnson(-like) noise based secure communicator
Authors:Laszlo B. Kish  Jacob Scheuer
Affiliation:a Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX 77843-3128, USA
b School of Electrical Engineering, Tel-Aviv University, Ramat-Aviv, Israel
c Center for Nanoscience and Nanotechnology, Tel-Aviv University, Ramat-Aviv, Israel
Abstract:We re-evaluate the impact of wire resistance on the noise voltage and current in the Johnson(-like) noise based secure communicator, correcting the result presented in [J. Scheuer, A. Yariv, Phys. Lett. A 359 (2006) 737]. The analysis shown here is based on the fluctuation-dissipation and the linear response theorems. The results indicate that the impact of wire resistance in practical communicators is significantly lower than the previous estimation.
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