Non-contact atomic force microscopy studies of (2 × 4) InP(0 0 1) surface |
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| Authors: | Bartosz Such Jacek J Kolodziej Piotr Piatkowski |
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| Institution: | a Marian Smoluchowski Institute of Physics, Jagiellonian University, Reymonta 4, 30-059 Krakow, Poland
b Regional Laboratory for Physicochemical Analyses and Structural Research, Jagiellonian University, Ingardena 3, 30-060 Kraków, Poland |
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| Abstract: | A sputter-cleaned indium-rich (2 × 4) InP(0 0 1) surface was investigated by non-contact scanning atomic force microscopy (NCAFM). Atomically-resolved images of the surface exhibit two different patterns. The patterns can be interpreted within the mixed dimer model of (2 × 4) reconstructed InP(0 0 1) surface. It is shown that due to contrast formation mechanism in NCAFM the features resolved are in close correspondence to scanning tunnelling microscopy (STM) data. Due to chemical interaction a P-terminated tip gives the image similar to an empty-state STM image, whereas an In-terminated tip gives the image resembling a filled-state STM one. Moreover, it is shown that due to dipole-dipole interaction, NCAFM can be sensitive to orientation of In-P dimers. |
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| Keywords: | Indium phosphide InP III-V semiconductors Non-contact atomic force microscopy NCAFM Atomic surface structure Surface reconstruction |
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