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Investigation of the relationship between the ionic conductivity and the local structures of singly and doubly doped ceria compounds using EXAFS measurement |
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| Authors: | Hiroyuki Yoshida Hiroshi Deguchi Kazuhiro Miura Masaki Horiuchi Toru Inagaki |
| Institution: | a Technical Research Center, The Kansai Electric Power Company, Inc., 11-20 Nakoji 3-Chome Amagasaki, Hyogo 661-0974, Japan b Kanden Kakou Co. Ltd., 2-1-1800, Benten 1-Chome, Minato-ku, Osaka 552-0007, Japan |
| Abstract: | The oxide ionic conductivity measurements of singly and doubly doped ceria compounds were carried out. Singly and doubly doped ceria used in this study were Ce0.8Ln0.2O1.9 (Ln=Y, Sm, Nd, or La) and Ce0.8La0.1Y0.1O1.9, respectively. Lattice constants of these compounds were in proportion to the ionic radius of the dopant(s). The doubly doped ceria compound showed oxide ionic conductivity comparative to the average of that of each corresponding singly doped sample. This finding indicates that the conductivity is influenced by both dopants in the doubly doped compounds. The extended X-ray absorption fine structure (EXAFS) study showed that the coordination number of oxide ions at the nearest neighbor of cation was related to the ionic conductivity. It was found that the conductivity gave the highest value when oxygen vacancies were randomly distributed in the lattice. This indicates that the local structure seriously affects oxide ionic conduction in singly and doubly doped ceria compounds. |
| Keywords: | Doped ceria Ionic conductivity EXAFS Local structure Double doping |
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