AFM phase imaging of thin films of electronically conducting polymer polybithiophene prepared by electrochemical potentiodynamic deposition

Nanoscale properties of thin films of conducting polymer polybithiophene (PBT) deposited under potentiostatic and potentiodynamic conditions were compared using ex-situ atomic force microscopy (AFM) and its extension called phase imaging (PI-AFM). While the morphologies of the films prepared using the two techniques were quite similar, the phase contrast measurements revealed a profound difference in the mechanisms of potentiostatic and potentiodynamic electropolymerization, as well as in the nanoscale crystallinity and grain structure of the resulting polymer films. The overall crystallinity and degree of order were always higher for films deposited at constant potential. The differences were especially pronounced at the early deposition stages (film thicknesses of ca. 10 nm).