The use of a diode laser in an ESPI system |
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Authors: | C. Wykes M. Flanagan |
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Affiliation: | 1. CW is in the Department of Production Engineering and Production Management, University of Nottingham, University Park, Nottingham NG7 2RD, USA;2. MF is in the Department of Mechanical Engineering, Coventry (Lanchester) Polytechnic, Priory St., Coventry CV1 5FB, USA;1. College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha, Hunan, P.R. China;2. Nanhu Laser Laboratory, National University of Defense Technology, Changsha, Hunan, P.R. China;3. State Key Laboratory of Pulsed Power Laser Technology, Changsha, Hunan, P.R. China |
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Abstract: | The use of a diode laser in an ESPI system is reported. These lasers have considerable potential advantages over gas lasers in terms of convenience, cost and lifetimes, and may eventually replace the latter in this type of instrument. |
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Keywords: | lasers speckle interferometry fringes |
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