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Fabrication and characterization of V-gate AIGaN/GaN high-electron-mobility transistors
Authors:Zhang Kai  Cao Meng-Yi  Chen Yong-He  Yang Li-Yuan  Wang Chong  Ma Xiao-Hua  and Hao Yue
Institution:1 Key Laboratory for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi' an 710071, China 2 School of Technical Physics, Xidian University, Xi ' an 710071, China)
Abstract:
Keywords:high-electron-mobility transistors  electric-field distribution  field plate  current dispersion
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