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Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP) |
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| Authors: | Ian Reid Yufeng Zhang Andrew Blueser James E Downes Greg Hughes |
| Institution: | a Department of Physics, Boston University, 590 Commonwealth Ave, Boston, MA 02215, USA b Dublin City University, School of Physical Sciences, Dublin, Ireland c MQ Photonics, Department of Physics and Engineering, Macquarie University, North Ryde, NSW 2109, Australia d U.S. Air Force Office of Scientific Research, Washington, DC, USA |
| Abstract: | The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations. |
| Keywords: | Copper tetraphenylporphyrin (CuTPP) X-ray photoemission spectroscopy Resonant soft X-ray emission spectroscopy X-ray absorption spectroscopy |
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