Response of chemical vapor deposition diamond detectors to X-ray |
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Authors: | Zhang Minglong Xia Yiben Wang Linjun Shen Hujiang |
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Affiliation: | School of Materials Science and Engineering, Shanghai University, Shanghai University Jiading, Shanghai 201800, China |
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Abstract: | The outstanding properties of diamond, such as radiation hardness, high carrier mobility, high band gap and breakdown field, distinguish it as a good candidate for radiation detectors. The detector's performance is strongly limited by the concentration of defects (grain boundaries and/or impurities) in chemical vapor deposition (CVD) diamond. We report the response of free-standing CVD diamond with a thickness of 300 μm and area of 2×2 cm2, synthesized by a hot filament chemical vapor deposition (HFCVD) technique, to 5.9 keV X-ray radiation from a 55Fe source. The linear I-V characteristics indicate that CVD diamond has good ohmic contacts. This detector also shows good results such as dark-current of 10−8 A, photocurrent of 10−6 A, energy resolution <0.4%, and a high ratio of signal to noise. |
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Keywords: | A. Chemical vapor deposition diamond C. X-ray D. Radiation detector |
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