High resolution surface imaging of Co/ZrO2 catalyst by TOF-SIMS

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a useful tool for the characterization of supported catalyst. Especially, the possibility of surface imaging appears very interesting. The images of not only elements distribution but also molecules or their fragments may be performed. Owing to the fast improvement of time-of-flight secondary ions mass spectrometers, obtaining the surface images with lateral resolution even below 100 nm is possible. The application of TOF-SIMS to the high resolution surface imaging of catalysts surfaces was shown. The influence of the preparation conditions of Co/ZrO₂ catalyst on the dispersion and composition of the active phase was investigated. The Co⁺/Zr⁺ and CoOH⁺/Zr⁺ intensity ratio values were calculated.