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非对称HALO掺杂栅交叠轻掺杂漏围栅MOSFET的解析模型
引用本文:李聪,庄奕琪,韩茹,张丽,包军林.非对称HALO掺杂栅交叠轻掺杂漏围栅MOSFET的解析模型[J].物理学报,2012,61(7):78504-078504.
作者姓名:李聪  庄奕琪  韩茹  张丽  包军林
作者单位:1. 西安电子科技大学微电子学院, 宽禁带半导体材料与器件重点实验室, 西安 710071;2. 西北工业大学航空微电子中心, 西安 710072
基金项目:中央高校基本科研业务费专项资金(批准号: K50511250001)和国家自然科学基金(批准号: 61076101)资助的课题.
摘    要:为抑制短沟道效应和热载流子效应, 提出了一种非对称HALO掺杂栅交叠轻掺杂漏围栅MOSFET新结构. 通过在圆柱坐标系中精确求解三段连续的泊松方程, 推导出新结构的沟道静电势、阈值电压以及亚阈值电流的解析模型. 结果表明, 新结构可有效抑制短沟道效应和热载流子效应, 并具有较小的关态电流. 此外, 分析还表明栅交叠区的掺杂浓度对器件的亚阈值电流几乎没有影响, 而栅电极功函数对亚阈值电流的影响较大. 解析模型结果和三维数值仿真工具ISE所得结果高度符合.

关 键 词:非对称HALO掺杂  栅交叠轻掺杂漏  围栅MOSFET  解析模型
收稿时间:2011-09-14

Analytical modeling of asymmetric HALO-doped surrounding-gate MOSFET with gate overlapped lightly-doped drain
Li Cong,Zhuang Yi-Qi,Han Ru,Zhang Li,Bao Jun-Lin.Analytical modeling of asymmetric HALO-doped surrounding-gate MOSFET with gate overlapped lightly-doped drain[J].Acta Physica Sinica,2012,61(7):78504-078504.
Authors:Li Cong  Zhuang Yi-Qi  Han Ru  Zhang Li  Bao Jun-Lin
Institution:1. Key Laboratory for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, China;2. Aviation Microelectronics Center, Northwestern Polytechnic University., Xi'an 710072, China
Abstract:A novel asymmetric HALO-doped surrounding-gate MOSFET with gate overlapped lightly-doped drain is presented. The performance of the new structure is studied by developing physics-based analytical models for surface potential, threshold voltage, and subthreshold current. It is found that the new structure can effectively suppress the short-channel effects and the hot-carrier effects, and simultaneously reduce the off-state current. It is also revealed that subthreshold current is a slight function of doping concentration of overlapped region, while work-function of gate electrode has a strong influence on subthreshold current. The accuracy of the analytical model is verified by its good agreement with the three-dimensional numerical device simulator ISE.
Keywords:asymmetric HALO-doping  gate overlapped lightly-doped drain  surrounding-gate MOSFET  analytical model
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