| Shapiro Steps in Flux-Trapped Surface Intrinsic Junctions of Bi2Sr2CaCu2O8＋δ |
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| 作者姓名： | 魏彦锋 赵士平 朱晓波 陈赓华 任育峰 于洪伟 杨乾声 胡云 |
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| 作者单位： | [1]BeijingNationalLaboratoryforCondensedMatterPhysics,InstituteofPhysics,ChineseAcademyofSciences,Beijing100080 [2]DepartmentofPhysics,UniversityofScienceandTechnologyofChina,Hefei230026 |
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| 摘 要： | ![]()
Microwave-field responses of the surface intrinsic Josephson junctions (IJJs) of Bi2Sr2CaCu2O8 δ superconductors are investigated. The IJJs are fabricated using an in situ low-temperature cleavage technique, which leads to the well-characterized surface CuO2 double layers and surface junctions. For the surface junctions in the largejunction limit, usually no Shapiro steps appear when a microwave field is applied. It is found that when the junctions are in a flux-trapped state, which is produced by a pulsed current and in which the critical current is significantly suppressed, clear Shapiro steps can be observed. These results are important for the study of the microwave-field properties of vortex-carrying IJJs and may find their use in device applications.
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| 关 键 词： | 微波场 约瑟夫森效应 超导体 表面连接 |
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