| Abstract: | The infrared absorption enhancement phenomenon in the normal configuration of vacuum‐evaporated metal films on a transparent substrate is known to depend not only on the metal film morphology but also on the local structures of metal particles. To date, however, few studies have examined the effect of local structure on the phenomenon. Size distributions of islands and gaps, along with the volume fractions of Ag in thin films, were measured using scanning electron microscopy as a function of film thickness. The local structure of Ag nano clusters deposited on silicon substrates was investigated using a total conversion electron yield X‐ray absorption fine structure (XAFS) method at the Ag K‐edge. We observed a correlation between the electromagnetic field intensity at the surface as evaluated by IR measurement and the coordination numbers evaluated by XAFS. We found that the film morphology had a greater effect on resonant and nonresonant contributions than did the local structure of a particle. Copyright © 2006 John Wiley & Sons, Ltd. |
