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Summary of ISO/TC201 technical report: ISO/TR 18392: 2005—Surface chemical analysis—X‐ray photoelectron spectroscopy—Procedures for determining backgrounds |
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| Abstract: | ISO Technical Report 18392 provides the guidance for determining backgrounds in X‐ray photoelectron spectra. The methods of background determination described in this report are applicable for the quantitative evaluation of the spectra of photoelectrons and Auger electrons excited by X‐rays from solid surfaces and surface nanostructures. Copyright © 2006 John Wiley & Sons, Ltd. |
| Keywords: | XPS X‐ray photoelectron spectroscopy ISO International Organization for Standardization background determination inelastic and elastic electron scattering quantitative surface analysis |