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A comparative XPS and UPS study of VOx layers on mineral TiO2(001)‐anatase supports
Abstract:Four vanadium oxide layers on mineral TiO2(001)‐anatase supports with different thickness (3–33 Å) were prepared with reactive d.c. magnetron sputtering and were extensively studied with photoelectron spectroscopy. Al Kα radiation and 150 eV synchrotron radiation were used as excitation sources. The evolution of the 2p, 3s and 3p core level line shapes of V and Ti as a function of the vanadium oxide thickness was studied, as well as the O1s and O2s core lines and the valence band. All the V2p spectra of the deposited vanadium oxide layers consist of at least 60% V5+, the rest being V4+. The V3p region is complicated by multiplet splitting, which prevents the determination of the vanadium oxidation state. The V3p multiplet splitting is different for the two excitation energies. No reduction of the titania support surface due to the vanadium oxide deposition was observed. Copyright © 2006 John Wiley & Sons, Ltd.
Keywords:photoelectron spectroscopy  XPS and UPS  synchrotron radiation  supported vanadium oxide  TiO2 anatase  VOx/TiO2(001)‐anatase catalysts
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