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Phonon observations from noise measurements |
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| Authors: | Mihai Mihǎilǎ |
| Affiliation: | R & D Center for Semiconductors (CCSITS). Str. Erou Iancu Nicolae 32B, 72996 Bucharest, Romania |
| Abstract: | From mobility fluctuation noise parameter measurements five phononic energies corresponding to LO, TO vibrational modes as well as TA + S2 or O, TO + TA, TO + O combined modes were identified. They stand for phonon replicas of non-radiative recombination processes. It is thus demonstrated that the carrier-phonon interaction is the source of noise in semiconductors. |
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