Flourescence detection of surface exafs |
| |
| Authors: | Steve M. Heald Edward Keller Edward A. Stern |
| |
| Affiliation: | Brookhaven National Laboratory, Upton, NY, USA;Physics Department, University of Washington, Seattle, WA, USA |
| |
| Abstract: | The possibilities for flourescence detection of surface EXAFS are studied using thin films of gold on various substrates. For glancing incidence angles it is found that excellent signal to noise ratios can be obtained even for submonolayer films, demonstrating that the technique should have wide applicability to surface and near surface systems. In many cases the signal to noise is superior to electron detection techniques, and its sensitivity suggests the method may also be useful for detection of trace elements on surfaces. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
