Wafer thickness optimization for silicon solar cells of heterogeneous material quality |
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| Authors: | Bernhard Michl Martin Kasemann Wilhelm Warta Martin C. Schubert |
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| Affiliation: | 1. Fraunhofer Institut für Solare Energiesysteme, Heidenhofstr. 2, 79110 Freiburg, Germany;2. Department of Microsystems Engineering, Albert‐Ludwig University of Freiburg, 79110 Freiburg, Germany |
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| Abstract: | In this Letter, we introduce a method of calculating the optimal wafer thickness for silicon solar cells with multicrystalline bulk material. The optimal thickness depends on the relation of bulk recombination to surface recombination and the light trapping. For multicrystalline silicon bulk recombination strongly varies laterally and with injection level, which complicates the calculations. A thickness optimization using the “Efficiency Limiting Bulk Recombination Analysis” (ELBA) takes all these effects correctly into account. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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| Keywords: | wafer thickness multicrystalline silicon solar cell |
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