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Quantenchemische Untersuchung der Elementarprozesse beim Plasmaätzen im System Fluor/Silizium
Authors:Christian Opitz  Hans Müller  Adnan Kodlaa
Institution:(1) Sektion Chemie, Friedrich-Schiller-Universität Jena, DDR-6900 Jena, Germany
Abstract:Summary Using the cluster model of the silicon (111) surface we derive by means of EHT calculations a mechanism of reactive plasma etching in the system F/Si including diffusion processes. Species SiF2 are found to be the primary etching products at the surface. SiF4 is formed with high probability in the gas phase.
Keywords:Silicon  Fluorine  Plasma etching  Elementary reactions  Cluster model  EHT method
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