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帽层对极紫外多层膜反射特性影响分析
引用本文:王洪昌,王占山,李佛生,秦树基,杜芸,王利,张众,陈玲燕.帽层对极紫外多层膜反射特性影响分析[J].物理学报,2004,53(7):2368-2372.
作者姓名:王洪昌  王占山  李佛生  秦树基  杜芸  王利  张众  陈玲燕
作者单位:同济大学精密光学工程技术研究所,物理系,上海 200092
基金项目:国家自然科学基金(批准号:60178021)、上海市科技攻关项目(批准号:022261049)和国家高技术研究发展计划(批准号:2002AA847050)资助的课题.
摘    要:介绍了在极紫外波段,利用帽层材料来减少多层膜反射镜因外部环境干扰而造成的反射率降低,使多层膜光学元件能够长时间稳定工作.计算了在139nm波长处Mo/Si极紫外多层膜反射镜在表面镀制不同帽层材料时的理论最大反射率,利用单纯形调优法,对帽层和多层膜的周期厚度进行优化,同时把分层理论用于多层膜帽层优化,可使多层膜的反射率得到进一步提高.分析了在加入帽层前后多层膜外层电场强度的分布变化情况. 关键词: 多层膜 反射率 帽层 极紫外

关 键 词:多层膜  反射率  帽层  极紫外
文章编号:1000-3290/2004/53(07)/2368-05
收稿时间:2003-06-27

Analysis of the reflective performance of EUV multilayer under the influence of capping layer
Wang Hong-Chang,Wang Zhan-Shan,Li Fo-Sheng,Qin Shu-Ji,Du Yun,Wang Li,Zhang Zhong and Chen Ling-Yan.Analysis of the reflective performance of EUV multilayer under the influence of capping layer[J].Acta Physica Sinica,2004,53(7):2368-2372.
Authors:Wang Hong-Chang  Wang Zhan-Shan  Li Fo-Sheng  Qin Shu-Ji  Du Yun  Wang Li  Zhang Zhong and Chen Ling-Yan
Abstract:In this paper we present a solution that addresses the reflectance loss due to oxidation. The solution is a capping layer (CL) that acts as an effective oxidation barrier when the multilayer (ML) is exposed to the extreme ultraviolet (EUV) light in the presence of water vapor, so that the optical element of multilayer can be used as long as possible. The theoretical reflectivity of ML Mo/Si EUV mirrors is calculated at 13.9nm under the different CL materials. The thicknesses of the CL and standard ML are optimized by the simplex method, meanwhile the reflectivity of ML can be further enhanced when the layer-by-layer theory is used. Finally the electric-field intensity distribution in the top layers of the ML is analyzed when the CL is added.
Keywords:multilayer  reflectivity  capping layer  extreme ultraviolet
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