Superior electromechanical performance over PZT, in lead zinc niobate (PZN)–lead zirconium titanate (PZT) thin films

Strongly oriented thin films of lead zinc niobate (PZN)–lead zirconium titanate (PZT) with (La,Sr)CoO₃ lower electrodes were grown on MgO {001} substrates by pulsed laser deposition. The films were perovskite-dominated with strong in-plane and out-of-plane orientations. Room-temperature functional characterisation indicated that the films were ferroelectric, with dielectric constant ∼550 and loss tangent ∼0.08 at 1 kHz. The crystallographic strain, as a function of applied dc field, was monitored by in situ X-ray diffraction. The maximum electric-field-induced crystallographic strain (∼0.22%) was comparable to that observed in bulk, but at significantly greater field (∼150 kV cm^-1). The effective d₃₃ value obtained from the crystallographic strain data was around 150 pm V^-1, which is high for ferroelectric thin films 400 nm in thickness. The local polarisation-switching properties of the films were investigated using a piezo-response atomic force microscope. Domain maps for a 5×5 μm² region of material were recorded as a function of dc bias, and confirmed the ferroelectric switching behaviour. PACS 81.05.Je; 81.40.Vw; 68.37.Lp