首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Growth and Morphological Study of Graded-Gap Si–Si1 – xGex–GaAs Structures
Authors:Saidov  A S  Razzokov  A Sh
Institution:1.Physical-Technical Insitute, SPA “Physics-Sun,” Uzbekistan Academy of Sciences, Tashkent, Uzbekistan
;2.Urgench State University, Urgench, Uzbekistan
;
Abstract:Crystallography Reports - Single-crystal films of Si1 – xGex (0 < x < 1) solid solution have been grown on Si substrates by liquid-phase epitaxy, and a...
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号