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Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data |
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| Authors: | Folomeshkin M. S. Boikova A. S. Volkovsky Yu. A. Marchenkova M. A. Prosekov P. A. Seregin A. Yu. |
| Affiliation: | 1.Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia ;2.National Research Center “Kurchatov Institute”, 123182, Moscow, Russia ; |
| Abstract: | Crystallography Reports - Thin lysozyme films on single-crystal silicon wafers have been studied by X-ray reflectivity. The films have been formed using the modified Langmuir–Schaefer method... |
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