| ATLEED对表面结构分析的可靠性研究 |
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| 引用本文： | 谭忠民,邓丙成.ATLEED对表面结构分析的可靠性研究[J].原子与分子物理学报,2000,17(1):75-78. |
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| 作者姓名： | 谭忠民 邓丙成 |
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| 作者单位： | 1. 华南建设学院环境工程系,广州,510405
2. 华南建设学院基础部,广州,510405 |
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| 摘 要： | 研究自动张量低能电子衍射对半导体复杂表面结构的有效搜寻范围,它比金属表面或金属吸附表面的有效搜寻范围要小。利用自动张量低能电子衍射对GaAs(111)-p(2×2)表面空位弛豫模型做了详细分析,理论计算和实验曲线符合得很好。
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| 关 键 词： | 自动张量低能电子衍射 有效搜寻范围 表面结构 |
Reliabitity study of ATLEED for surface structure analysis |
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| TAN Zhong-min,DENG Bing-cheng.Reliabitity study of ATLEED for surface structure analysis[J].Journal of Atomic and Molecular Physics,2000,17(1):75-78. |
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| Authors: | TAN Zhong-min DENG Bing-cheng |
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| Abstract: | We study the range of atomic displacements upon which Tensor LEED(TLEED) is based keeping valid on compound semiconductor surface.This range, with which the automatic search function of TLEED is good, is smaller than that of metal or metal absorbed surface.A detailed ATLEED analysis has been made for te GaAs(111)-p(2×2) vacancy-buckling model.A good level of correspondence between calculated and experimental intensities has been reached. |
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| Keywords: | automated tensor LEED valid range of search surface structure |
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