Thermal stability of poly(vinylidene fluoride) films pre-annealed at various temperatures |
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Authors: | Masahiro Inoue Yasunori Tada Hiroshi Ishiguro |
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Affiliation: | a The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan b Department of Adaptive Machine systems, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan |
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Abstract: | This paper investigates the relationship between the pre-annealing conditions and the thermal stability of uniaxially-drawn poly(vinylidene fluoride) (PVDF) films in order to clarify their technical limits in terms of temperatures that can be used for assembly processes and for practical applications. Specimens that are pre-annealed below their melting temperature apparently shrink in the stretch-direction when they are exposed to elevated temperatures above the pre-annealing temperature. Since the content of β-PVDF in the films decreases simultaneously with the shrinkage, their piezoelectric properties also deteriorate. In addition, there is a suggestion that the level of polarization in the remaining β-phase decreases significantly during annealing above 90-100 °C. However, the dimensions and the piezoelectric coefficients of the films remain stable during annealing below the pre-annealing temperature. Therefore, the thermal stability of PVDF films can be controlled practically by using the appropriate pre-annealing temperature. By contrast, the films were softened at 90-100 °C when the pre-annealing treatment was conducted above the melting temperature. The softening of films that are pre-annealed above the melting temperature is a different phenomenon from that observed in specimens that are pre-annealed below the melting temperature. |
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Keywords: | Poly(vinylidene fluoride) Semicrystalline polymers Piezoelectricity Annealing Shrinkage |
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