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Atomic modeling of the plasma EUV sources
Authors:Akira Sasaki   Atsushi Sunahara   Hiroyuki Furukawa   Katsunobu Nishihara   Takeshi Nishikawa   Fumihiro Koike  Hajime Tanuma
Affiliation:aQuantum Beam Science Directorate, Japan Atomic Energy Agency, 8-1 Umemidai, Kizugawa-shi, Kyoto 619-0215, Japan;bInstitute for Laser Technology, Japan;cInstitute for Laser Engineering, Osaka University, Japan;dFaculty of Engineering, Okayama University, Japan;eSchool of Medicine, Kitasato University, Japan;fFaculty of Science, Tokyo Metropolitan University, Japan
Abstract:We present the development of population kinetics models for tin plasmas that can be employed to design an EUV source for microlithography. The atomic kinetic code is constrained for the requirement that the model must be able to calculate spectral emissivity and opacity that can be used in radiation hydrodynamic simulations. Methods to develop compact and reliable atomic model with an appropriate set of atomic states are discussed. Specifically, after investigation of model dependencies and comparison experiment, we improve the effect of configuration interaction and the treatment of satellite lines. Using the present atomic model we discuss the temperature and density dependencies of the emissivity, as well as conditions necessary to obtain high efficiency EUV power at λ = 13.5 nm.
Keywords:EUV lithography   Laser produced plasma   Opacity   Collisional-radiative model   Plasma spectroscopy
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